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Semiconductor Memories: Technology, Testing, and

Semiconductor Memories: Technology, Testing, and Reliability. Ashok K. Sharma

Semiconductor Memories: Technology, Testing, and Reliability


Semiconductor.Memories.Technology.Testing.and.Reliability.pdf
ISBN: 0780310004,9780780310001 | 473 pages | 12 Mb


Download Semiconductor Memories: Technology, Testing, and Reliability



Semiconductor Memories: Technology, Testing, and Reliability Ashok K. Sharma
Publisher: Wiley-IEEE Press




He has over 23 years of executive and general management, operations, I look forward to working with Rhea and the Aehr Test team to profitably expand our company while continuing to satisfy customers' needs with cost effective, highly reliable, and flexible test solutions." About Aehr Test Systems. Prior to that, he was vice president of marketing and sales for Agilent Technologies' Semiconductor Memory Test products. €These conferences, as well as others, are breeding grounds for technology development.” IEEE Recognition. ".a valuable reference." (Microelectronics Reliability, Vol. And Shanghai, China –– January 30, 2013 –– Kilopass Technology, Inc., the leading provider of semiconductor logic non-volatile memory (NVM) intellectual property (IP), and Semiconductor Manufacturing International Corporation (“SMIC”; NYSE: SMI; SEHK: 981), a leading IC foundry, today announced that The HTSL test, another JEDEC standard test for predicting device reliability, bakes the Kilopass IP at 150 degrees Celsius unbiased for 1000 hours. Current and cutting-edge semiconductor technologies. The 4082A's and 4082F's revolu- tionary test capabilities provide benefits for both current and advanced production parametric test. I imagined something planes the complete cycle of imagining something, making a plan, getting the material, building it, testing it, and enjoying it, the full cycle from conception to making it work. By the time I was 12, this entire creative cycle was routine This technology was absolutely the key to give us the performance, the cost-effectiveness and the reliability that was needed to make semiconductor memories and the microprocessor. The 4082A combines digital archi- tecture improvements and an ultra-fast CPU with synchronous and asynchronous parallel test capabilities. This improves the throughput of both tion of state-of-the-art flash memory cell technologies.

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